{"id":13559,"date":"2021-02-03T22:24:52","date_gmt":"2021-02-03T22:24:52","guid":{"rendered":"https:\/\/nanopartikel.info\/glossar\/sem\/"},"modified":"2021-07-06T14:29:18","modified_gmt":"2021-07-06T14:29:18","slug":"sem","status":"publish","type":"glossary","link":"https:\/\/nanopartikel.info\/en\/glossar\/sem\/","title":{"rendered":"SEM"},"content":{"rendered":"<p>Abbreviation for <em>Scanning Electron Microscope<\/em>. A device to study smallest samples by scanning the object using electron beams. The resulting images are detailed illustrations of the object surfaces and have a great depth of field.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Abbreviation for Scanning Electron Microscope. A device to study smallest samples by scanning the object using electron beams. The resulting images are detailed illustrations of the object surfaces and have a great depth of field.<\/p>\n","protected":false},"author":6,"featured_media":0,"menu_order":0,"template":"","meta":[],"acf":[],"_links":{"self":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/13559"}],"collection":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary"}],"about":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/types\/glossary"}],"author":[{"embeddable":true,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/users\/6"}],"version-history":[{"count":2,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/13559\/revisions"}],"predecessor-version":[{"id":17040,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/13559\/revisions\/17040"}],"wp:attachment":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/media?parent=13559"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}