{"id":3529,"date":"2020-11-06T00:29:33","date_gmt":"2020-11-06T00:29:33","guid":{"rendered":"https:\/\/dana.ggiants.de\/glossary\/tem\/"},"modified":"2021-07-08T10:25:55","modified_gmt":"2021-07-08T10:25:55","slug":"tem","status":"publish","type":"glossary","link":"https:\/\/nanopartikel.info\/en\/glossar\/tem\/","title":{"rendered":"TEM"},"content":{"rendered":"<p>Abbreviation for <em><u>T<\/u>ransmission <u>e<\/u>lectron <u>m<\/u>icroscopy<\/em>. A device to study smallest samples by shining electron beams through the object. To allow the electron beam to pass through the object, it has to be very thin.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Abbreviation for Transmission electron microscopy. A device to study smallest samples by shining electron beams through the object. To allow the electron beam to pass through the object, it has to be very thin.<\/p>\n","protected":false},"author":6,"featured_media":0,"menu_order":0,"template":"","meta":[],"acf":[],"_links":{"self":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/3529"}],"collection":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary"}],"about":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/types\/glossary"}],"author":[{"embeddable":true,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/users\/6"}],"version-history":[{"count":5,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/3529\/revisions"}],"predecessor-version":[{"id":17294,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/3529\/revisions\/17294"}],"wp:attachment":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/media?parent=3529"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}