{"id":3638,"date":"2020-11-06T00:29:33","date_gmt":"2020-11-06T00:29:33","guid":{"rendered":"https:\/\/dana.ggiants.de\/glossary\/afm\/"},"modified":"2021-02-03T22:24:56","modified_gmt":"2021-02-03T22:24:56","slug":"afm","status":"publish","type":"glossary","link":"https:\/\/nanopartikel.info\/en\/glossar\/afm\/","title":{"rendered":"AFM"},"content":{"rendered":"<p>  \t  \t\tShort for atomic force microscopy. The <span class=\"glossaryLink\"  aria-describedby=\"tt\"  data-cmtooltip=\"&lt;div class=glossaryItemTitle&gt;AFM&lt;\/div&gt;&lt;div class=glossaryItemBody&gt;  \t  \t\tShort for atomic force microscopy. The AFM tip scans the sample line for line. Due to repulsion between needle and sample  a movement of the tip is detected. A three dimensional image can be simulated.  \t  &lt;\/div&gt;\"  data-gt-translate-attributes='[{\"attribute\":\"data-cmtooltip\", \"format\":\"html\"}]'>AFM<\/span> tip scans the sample line for line. Due to repulsion between needle and sample  a movement of the tip is detected. A three dimensional image can be simulated.  \t  <\/p>\n","protected":false},"excerpt":{"rendered":"<p>atomic force microscopy<\/p>\n","protected":false},"author":6,"featured_media":0,"menu_order":0,"template":"","meta":[],"acf":[],"_links":{"self":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/3638"}],"collection":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary"}],"about":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/types\/glossary"}],"author":[{"embeddable":true,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/users\/6"}],"version-history":[{"count":3,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/3638\/revisions"}],"predecessor-version":[{"id":15694,"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/glossary\/3638\/revisions\/15694"}],"wp:attachment":[{"href":"https:\/\/nanopartikel.info\/en\/wp-json\/wp\/v2\/media?parent=3638"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}